Leica TIC020 Ion Miller
Cross section polishing
Specifications:
- 3 axes movement possible
- Lateral: 10 mm
- Vertical: 2 mm
- Travel range between mask and sample: 6 mm
- Maximum sample size for cross-section milling: 10 mm * 10 mm * 7 mm
- Polished area ~ 2 mm * 1 cm, if milled for 10 hours as shown in Figure 1 below
- Can achieve clean and smooth surface to observe under scanning electron microscope.
Figure 1. Milled sample
