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Leica TIC020 Ion Miller

TIC020

Cross section polishing

Specifications:

  • 3 axes movement possible 
    • Lateral: 10 mm
    • Vertical: 2 mm
  • Travel range between mask and sample: 6 mm
  • Maximum sample size for cross-section milling: 10 mm * 10 mm * 7 mm
  • Polished area ~ 2 mm * 1 cm, if milled for 10 hours as shown in Figure 1 below
  • Can achieve clean and smooth surface to observe under scanning electron microscope.
Milled sample

Figure 1. Milled sample


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