Dr. Priyanka Periwal

Research Interests

High resolution Electron Microscopy

Cathodoluminescence of semiconductors and geological samples.

Nanomaterial surface characterization

Crystal growth

Education

Ph.D. in Material Science, Joseph Fourier University, 2014

Integrated Dual Masters in Nanoscience and Nanotechnology, Delhi University & Joseph Fourier University, 2011

B. Sc. Chemistry, Hindu College, Delhi University, 2008

Professional History

Lab Manager, Department of Geological Sciences, The University of Texas at Austin, Apr-Jun 2019

Visiting Researcher at IBM T J Watson Research Center, New York, 2016-2018

Research Associate at University of Cambridge, UK, 2015-2018

Selected Publications

P. Periwal, N. V. Sibirev, G. Patriarche, B. Salem, F. Bassani, V. G. Dubrovskii, and T. Baron, Composition-Dependent Interfacial Abruptness in Au-Catalyzed Si1–xGex/Si/Si1–xGex Nanowire Heterostructures NanoLett., 14 (9), pp 5140–5147 (2014)

P. Periwal, T. Baron, P. Gentile, B. Salem, F. Bassani, Growth strategies to control tapering in Ge nanowires, APL Materials 2, 046105 (2014)

P Periwal, F Bassani, G Patriarche, L Latu-Romain, V Brouzet, B Salem, T Baron, Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy, physica status solidi (a) 2 (11) pp 509-513 (2014)

Selected Committees

Member, Microscopy Society of America

Awards

Best poster Award, Material Research Society, 2014

Best Microscopic Image Award, Nanoscience Foundation, 2014

EGIDE Scholarship, French Embassy in India, 2009-2010