Research Interests
High resolution Electron Microscopy
Cathodoluminescence of semiconductors and geological samples.
Nanomaterial surface characterization
Crystal growth
Education
Ph.D. in Material Science, Joseph Fourier University, 2014
Integrated Dual Masters in Nanoscience and Nanotechnology, Delhi University & Joseph Fourier University, 2011
B. Sc. Chemistry, Hindu College, Delhi University, 2008
Professional History
Lab Manager, Department of Geological Sciences, The University of Texas at Austin, Apr-Jun 2019
Visiting Researcher at IBM T J Watson Research Center, New York, 2016-2018
Research Associate at University of Cambridge, UK, 2015-2018
Selected Publications
P. Periwal, N. V. Sibirev, G. Patriarche, B. Salem, F. Bassani, V. G. Dubrovskii, and T. Baron, Composition-Dependent Interfacial Abruptness in Au-Catalyzed Si1–xGex/Si/Si1–xGex Nanowire Heterostructures NanoLett., 14 (9), pp 5140–5147 (2014)
P. Periwal, T. Baron, P. Gentile, B. Salem, F. Bassani, Growth strategies to control tapering in Ge nanowires, APL Materials 2, 046105 (2014)
P Periwal, F Bassani, G Patriarche, L Latu-Romain, V Brouzet, B Salem, T Baron, Interfacial abruptness in axial Si/SiGe heterostructures in nanowires probed by scanning capacitance microscopy, physica status solidi (a) 2 (11) pp 509-513 (2014)
Selected Committees
Member, Microscopy Society of America
Awards
Best poster Award, Material Research Society, 2014
Best Microscopic Image Award, Nanoscience Foundation, 2014
EGIDE Scholarship, French Embassy in India, 2009-2010
